New Inspection Technology Adaptive Background illumination (ABi) and Virtual X-ray

Inspection with Adaptive Background illumination (ABi) is a completely new concept tailored specifically for the demands of nonwoven inspection. A background illumination in transmission is combined with a reflection illumination for optimal inspection results. The background illumination intensity can be adapted to every material density and characteristic, offering a perfect optical compensation of the material noise for all products.

This leads to a significantly improved defect detection and classification based on a better signal-to-noise ratio compared to conventional inspection systems.

ABI can be combined with Virtual X-ray, which offers an illumination with ultra-high light intensity using modern high power LEDs. This is especially effective for detection and classification of e.g. small foreign material inclusions (differentiation between material noise and neps) on top, bottom as well as inside the nonwoven material. Thanks to the Dr. Schenk MIDA technology (Multiple image Defect Analysis), ABi and Virtual X-ray can be used on the same scan line by multiplexing between them.