A film thickness measurement system based on the microscopic spectrophotometry features the availability of non-contact and non-destructive measurements with high accuracy and high reproducibility.

FEATURES:

• Integratable and portable head with all function for thickness measurement
• Accurate absolute reflectance measurement (multi layer thickness/ optic constant)
• High speed measurement in 1 sec at a point
• Reflection objective lends for wide range measurement wavelength (UV – NIR)
• Safety mechanism with area sensor
• Automatic measurement with customizable sequence
• User-friendly wizard for optic constant analysis
• Microscopic measurement for micro spot

MEASURE ITEM

• Absolute reflectance measurement
• Thickness analysis
• Optic constant analysis (n: reflective index, k: extinction coefficient )